Critical Point and Vapor Pressure Measurements for 17 Compounds by a Low Residence Time Flow Method VonNiederhausern, D.M.; Wilson, G.M.; Giles, N.F.; Journal of Chemical & Engineering Data 2006, 51, 1990-1995
Data
T (K) P (kPa)
454.6 90.67
481.8 182.4
512.9 359.9
547.3 690.9
590.1 1381.0
638.8 2761.0
642.5 2934.0
644.4 3013.0
2814; diethyl oxalate; 00835