Vapor Pressure and Evaporation Coefficient Measurements at Elevated Temperatures with a Knudsen Cell and a Quartz Crystal Microbalance: New Data for SiO Wetzel, S.; Pucci, A.; Gail, H.P.; Journal of Chemical & Engineering Data 2012, 57, 1594-1601
Data
T (K) P (kPa)
1370 9e-05
1421 0.00023
1432 0.00027
1432 0.00028
1434 0.00033
1443 0.00034
1454 0.0004
1454 0.00041
1463 0.00047
1463 0.00049
1474 0.00055
1379 0.00013
1474 0.00057
1484 0.00065
1484 0.0007
1494 0.0007
1494 0.0008
1503 0.0008
1503 0.0009
1512 0.0008
1512 0.0011
1522 0.0013
1384 0.00012
1522 0.0012
1530 0.0015
1530 0.0014
1539 0.0016
1539 0.0016
1547 0.0018
1547 0.0019
1555 0.0021
1555 0.0021
1565 0.0023
1388 0.00014
1565 0.0024
1565 0.0027
1572 0.0026
1572 0.0028
1572 0.0031
1581 0.0029
1581 0.0031
1581 0.0035
1588 0.0031
1588 0.0036
1397 0.00015
1588 0.004
1596 0.0038
1596 0.0041
1596 0.0045
1604 0.0039
1604 0.0046
1604 0.005
1611 0.0042
1611 0.0052
1611 0.0055
1397 0.00015
1619 0.0046
1619 0.0058
1619 0.006
1628 0.005
1628 0.0066
1409 0.00018
1409 0.00019
1421 0.00023
19324; copper; 03733