• Critical behaviour study of ferroelectric semiconductors (PbxSn1−x)2P2S6 from thermal diffusivity measurements

Data

[{'id': 64814, 'desc': '1 datapoints in 1 series, <b>quantities:</b> Thermal diffusivity, <b>system:</b> tin(II) hypothiodiphosphate (Sn2P2S6)'}, {'id': 64815, 'desc': '235 datapoints in 1 series, <b>quantities:</b> Thermal diffusivity, <b>system:</b> lead(II) hypothiodiphosphate (Pb2P2S6)'}, {'id': 64816, 'desc': '7 datapoints in 1 series, <b>quantities:</b> Thermal diffusivity, <b>system:</b> tin(II) hypothiodiphosphate (Sn2P2S6) + lead(II) hypothiodiphosphate (Pb2P2S6)'}, {'id': 64817, 'desc': '1786 datapoints in 6 series, <b>quantities:</b> Thermal diffusivity, <b>system:</b> tin(II) hypothiodiphosphate (Sn2P2S6) + lead(II) hypothiodiphosphate (Pb2P2S6)'}] temp"